X-ray powder diffraction (XRD) is a powerful, well-established non-destructive technique for characterizing both organic and inorganic crystalline materials. XRD is used for research, competitive analysis and quality control in industries:
XRD pattern is the fingerprint of the periodic atomic arrangements in a given material. X-ray diffraction peaks are formed by constructive interference of a monochromatic beam of X-rays diffracted at specific angles from each set of lattice planes in a sample. The peak intensities are determined by the distribution of atoms within the lattice.
XRD is used for measuring % crystallinity, phase identification, quantitative analysis and to determine structure imperfections of samples, crystal defects & orientation.
LSAI’s XRD has the following capabilities:
It is brand new, highly advanced instrument that can provide high resolution data for the following analysis:
It’s a highly sensitive instrument due to use of the graphite monochromator coupled with scintillation counter to maximize sensitivity by optimizing peak to background noise, in addition to eliminating fluorescence from Fe, Ni, Co, and Mn containing materials for measuring trace phases.
LSAI’s XRD has a ICDD (International Centre for Diffraction Data) & NIST search database of X-ray diffraction patterns of ~200,000 that enables the phase identification of a large variety of crystalline samples.
LSAI’s XRD has a sample rotation stage which allows continuous rotation to minimize the effects of preferred orientation.
It has an Air sensitive sample holder for customers studying materials that might degrade in the presence of air.
Figure 1: Analytical Applications of XRD in various fields (Ref: Rev. Adv. Mater. Sci. 38 (2014) 95-109)
Figure 2: XRD Patterns from three different phases of SiO2 and Unique Crystal structure of SiO2 based Quartz and Cristobalite.